12 May Deep learning enhances automated electron microscopy
MVTec and Zeiss are collaborating on the new Zeiss Blockwise software platform for automated electron microscopy. According to the two companies, Zeiss has integrated MVTec’s machine vision software Halcon as the central image-processing component of the platform.
Zeiss Blockwise is a new software environment for automated measurement, analysis and inspection tasks in electron microscopy. The platform is designed primarily for semiconductor and microelectronics manufacturing applications, where large volumes of data, reproducible workflows and highly precise analysis processes are essential.
By integrating Halcon, Blockwise combines rule-based image processing methods with deep-learning technologies within a single development environment. This enables a wide range of inspection and analysis tasks to be performed flexibly and adapted to changing requirements.
According to the partners, a key focus of the platform is the close integration of image acquisition and analysis workflows. Based on captured microscopy data, downstream measurement and inspection steps can be defined and executed automatically. This is intended to increase the level of automation in complex analytical processes.
According to MVTec, Halcon includes more than 2,100 operators for industrial image processing and is widely used in semiconductor and microelectronics applications for inspection, measurement and classification tasks. The combination of conventional machine vision techniques and AI-based methods supports scalable and reproducible analysis processes.
Image caption: User interface of the Zeiss Blockwise software platform. Image: Zeiss
Source: www.mvtec.com/
Image: www.zeiss.com